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TXRF Spectrometers

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Total Reflection X-ray Fluorescence Spectrometry (TXRF) – Elemental Analysis, Process and Quality Control

Total reflection X-ray fluorescence spectrometry (TXRF) is the only X-ray technology offering detection limits in the low ppb range. TXRF is the method of choice for fast quantitative and semi-quantitative multi-element trace analysis (S4 TStar, S2 PICOFOX).

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S2 PICOFOX

The World's First TXRF Spectrometer for Trace Analysis The S2 PICOFOX is the world's firs...

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S4 TStar

High Performance TXRF Spectrometer for Ultra-Trace Element Analysis Total reflection X-ray fluore...

Experience gained during work with analytical equipments for more than 15 years

Our company, trough our specialists, are striving to support you in finding the best solutions and in solving you analytical challenges - together we will find the instrument type and configuration that will best comply with your requirements.

About Us

Total Spectrum is a company specialized on providing analytical solutions: analytical equipments, technical support, service, dedicated calibrations and methods developments for a wide range of applications.

Our complex and complete solutions "analytical device - technical support - service" represents a major advantage for our customers


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S.C. Total Spectrum S.R.L.

Address: Str. Heliade intre Vii nr.8, Sector 2, Bucuresti

Phone 1: +40-(0)21-316.67.81

Phone 2: +40-(0)31-405 28 82

Email: office@total-spectrum.ro